The effects of lithographic residues and humidity on graphene field effect devices

Autor: H. Çetin, Behiye Boyarbay Kantar, Muhittin Öztürk
Přispěvatelé: [Kantar, Behiye Boyarbay] Erciyes Univ, Fac Sci, Dept Phys, TR-38039 Kayseri, Turkey -- [Ozturk, Muhittin] Nigde Univ, Grad Sch Nat & Appl Sci, Dept Phys, TR-51240 Nigde, Turkey -- [Cetin, Hidayet] Bozok Univ, Art & Sci Fac, Dept Phys, TR-66900 Yozgat, Turkey, 0-Belirlenecek
Jazyk: angličtina
Rok vydání: 2017
Předmět:
Popis: WOS: 000397003200029
Recently, unknown-manner changes in charge neutrality point (CNP) positioning were ascribed to humidity at graphene field effect transistors (GFETs). While the exact means of humidity interacting with hydrophobic graphene remains unknown, this work examines pristine and lithographic-process-applied graphene surfaces with surface enhanced Raman spectra (SERS). SERS analysis shows that the lithographic-process-applied graphene does not have the same properties as those of pristine graphene. Furthermore, this study has experimentally investigated the effect of humidity on the transfer characteristics of GFET and proposed a model to explain the formation of asymmetric IDS-Vbg branches in accordance with the SERS results and humidity responses.
Scientific and Technical Research Council of Turkey (TUBITAK) [108T930]
We will never forget Asli SIMSEK, who was a master student at our group, and we would like to thank her for valuable contributions. We would like to thank ARGESAN for contribution in fabricating a mask aligner. This work was supported by the Scientific and Technical Research Council of Turkey (TUBITAK) under Grant no. 108T930.
Databáze: OpenAIRE