Surface Structure Determination of Black Phosphorus Using Photoelectron Diffraction

Autor: Abner de Siervo, Richard Landers, Lucas Barreto, Luis Henrique de Lima
Přispěvatelé: UNIVERSIDADE ESTADUAL DE CAMPINAS
Rok vydání: 2015
Předmět:
Zdroj: Repositório da Produção Científica e Intelectual da Unicamp
Universidade Estadual de Campinas (UNICAMP)
instacron:UNICAMP
DOI: 10.48550/arxiv.1511.02668
Popis: Agradecimentos: This work received financial support from FAPESP, CNPq (Project No. 455807/2014-0, 401826/2013-9, 308717/2012-0), and CAPES from Brazil. XPD measurements were done at LNLS under Proposal No. PGM-19062. L.H.L. and L.B. thank CNPq for postdoctoral fellowship support. The authors thanks the LNLS staff, especially J.C. Cezar, for technical support during beam time Abstract: The atomic structure of single-crystalline black phosphorus is studied using high-resolution synchrotron-based photoelectron diffraction (XPD). The results show that the topmost phosphorene layer in the black phosphorus is slightly displaced compared to the bulk structure and presents a small contraction in the direction perpendicular to the surface. Furthermore, the XPD results show the presence of a small buckling among the surface atoms, in agreement with previously reported scanning tunneling microscopy results. The contraction of the surface layer added to the presence of the buckling indicates a uniformity in the size of the sp3 bonds between P atoms at the surface FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULO - FAPESP CONSELHO NACIONAL DE DESENVOLVIMENTO CIENTÍFICO E TECNOLÓGICO - CNPQ COORDENAÇÃO DE APERFEIÇOAMENTO DE PESSOAL DE NÍVEL SUPERIOR - CAPES Aberto
Databáze: OpenAIRE