Reliability Determination of Nanoelectronic Devices Using Semi-Marcov Processes
| Autor: | J. Barański, Justyna Tomaszewska, Bartłomiej Kurzyk, Marek Iwaniuk, Tomasz Zienkiewicz |
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| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Materials science
reliability analysis probability T55-55.3 02 engineering and technology nanoelectronics devices 021001 nanoscience & nanotechnology 01 natural sciences 010305 fluids & plasmas Reliability engineering squid (superconducting quantum interference device) Industrial safety. Industrial accident prevention 0103 physical sciences 0210 nano-technology Safety Risk Reliability and Quality Reliability (statistics) |
| Zdroj: | Journal of KONBiN, Vol 50, Iss 3, Pp 277-296 (2020) |
| ISSN: | 2083-4608 |
| Popis: | The main purpose of the article is to investigate the reliability process of nanoelectronics devices. Firstly, the research problem is presented based on foreign data source. Then, the analytical method has been chosen – semi-Marcov processes. Next, according to the adopted method and input data, the operating process has been analyzed. Finally, the probabilities of objects being in particular operating states, e.g. in the state of failure-free operation have been determined. |
| Databáze: | OpenAIRE |
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