Initial observations of the femtosecond timing jitter at the European XFEL
| Autor: | Max Lederer, Henry Kirkwood, T. Tanikawa, Richard Bean, Matthieu Chollet, Cedric M. S. Takem, Hauke Höppner, M. Sikorski, Guido Palmer, Tomasz Jezynski, Klaus Giewekemeyer, Jens Buck, Motoaki Nakatsutsumi, Tokushi Sato, Romain Letrun, Adrian P. Mancuso, Patrik Vagovic, Henry N. Chapman, Yoonhee Kim, Grant Mills, Jia Liu, M. Makita, Zuzana Konôpková, Alexander Pelka, T. R. Preston, Sebastian Göde, Jan Grünert, Rita Graceffa, Samuele Di Dio Cafisio, Moritz Emons |
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| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: |
Electric fields
Refractive index Free electron lasers Physics::Optics 02 engineering and technology 01 natural sciences law.invention 010309 optics Data acquisition Optics law 0103 physical sciences ddc:530 Jitter Physics business.industry Resolution (electron density) X ray lasers Sorting 021001 nanoscience & nanotechnology Laser Atomic and Molecular Physics and Optics Femtosecond Femtosecond lasers 0210 nano-technology business Ultrashort pulse |
| Zdroj: | Optics letters 44(7), 1650-1653 (2019). doi:10.1364/OL.44.001650 Optics Letters 44(2019)7, 358067 |
| Popis: | Optics letters 44(7), 1650 - 1653 (2019). doi:10.1364/OL.44.001650 Intense, ultrashort, and high-repetition-rate X-ray pulses, combined with a femtosecond optical laser, allow pump-probe experiments with fast data acquisition and femtosecond time resolution. However, the relative timing of the X-ray pulses and the optical laser pulses can be controlled only to a level of the intrinsic error of the instrument which, without characterization, limits the time resolution of experiments. This limitation inevitably calls for a precise determination of the relative arrival time, which can be used after measurement for sorting and tagging the experimental data to a much finer resolution than it can be controlled to. The observed root-mean-square timing jitter between the X-ray and the optical laser at the SPB/SFX instrument at European XFEL was 308 fs. This first measurement of timing jitter at the European XFEL provides an important step in realizing ultrafast experiments at this novel X-ray source. A method for determining the change in the complex refractive index of samples is also presented. Published by OSA, Washington, DC |
| Databáze: | OpenAIRE |
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