Incorporation of aluminum into C-S-H structures: From synthesis to nanostructural characterization

Autor: Céline Cau-dit-Coumes, Christophe Joussot-Dubien, Julie Russias, Thierry Douillard, Annie Malchere, Fabien Frizon
Přispěvatelé: Laboratoire d'Etudes de l'Enrobage des Déchets (L2ED), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Service de Conditionnement des Déchets et Vitrification (SCDV), Matériaux, ingénierie et science [Villeurbanne] (MATEIS), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Consortium Lyon Saint-Etienne de Microscopie (CLYM), École normale supérieure de Lyon (ENS de Lyon)-École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Université Jean Monnet - Saint-Étienne (UJM), Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), École normale supérieure - Lyon (ENS Lyon)-École Centrale de Lyon (ECL), Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université Jean Monnet [Saint-Étienne] (UJM)
Jazyk: angličtina
Rok vydání: 2008
Předmět:
Nanostructure
Scanning electron microscope
Nano structures
Beam damages
Alumina
0211 other engineering and technologies
Analytical chemistry
Electron microscopes
Electrons
02 engineering and technology
Environmental scanning electron microscopes
Optoelectronic devices
law.invention
Scanning transmission electron microscopies
[SPI.MAT]Engineering Sciences [physics]/Materials
law
Polymer blends
021105 building & construction
Scanning transmission electron microscopy
X- ray diffractions
Materials Chemistry
Silicon compounds
Scanning
Environmental scanning electron microscope
Chemistry
Resolution (electron density)
Nanostructural
Scanning electron microscopes
Transmission electron microscopes
Electron beams
X ray diffraction analysis
021001 nanoscience & nanotechnology
Plates (structural components)
Low voltages
Fibrillar aggregates
Amorphous solid
Crystallography
Transmission electron microscopy
Synthesis (chemical)
Sem
Ceramics and Composites
Tem
Equilibrium solutions
Chemicals
Electron microscope
0210 nano-technology
Scanning electron microscopy
Aluminum
Zdroj: Journal of the American Ceramic Society
Journal of the American Ceramic Society, 2008, 91, pp.2337-2342. ⟨10.1111/j.1551-2916.2008.02450.x⟩
Journal of the American Ceramic Society, Wiley, 2008, 91, pp.2337-2342. ⟨10.1111/j.1551-2916.2008.02450.x⟩
ISSN: 0002-7820
1551-2916
DOI: 10.1111/j.1551-2916.2008.02450.x⟩
Popis: International audience; C-A-S-H (C=CaO, A=Al$_2$O$_3$, S=SiO$_2$, H=H 2O in cement nomenclature) phases have been synthesized from CaO, SiO$_2$, and AlNaO$_2$. The initial CaO/SiO$_2$ (C/S$_{initial}$) ratios varied from 0.8 to 1.5 and the initial Al$_2$O$_3$/SiO$_2$ (A/S$_{initial}$) ratio was set to 0.1. Samples were characterized by X-ray diffraction and chemical analyses of their equilibrium solutions. This paper describes experiments using a low-voltage scanning transmission electron microscopy (STEM-in-SEM) imaging system that allows transmission observations in an environmental scanning electron microscope. Observations of the nanostructure were also performed by transmission electron microscopy (TEM). Two types of morphologies were clearly observed: fine fibrillar aggregates and small plates, the latter being particularly sensitive to beam damage. Despite their different appearance, both of these phases were amorphous, and the small plates were richer in aluminum. The fraction of the small plate phase increased with the C/S$_{initial}$ ratio. TEM interpretations showed that C-A-S-H phases were not stable under the electron beam and high-magnification observations could significantly modify their structure. Images and chemical analyses acquired with STEM-in-SEM appeared as valuable sources of information because they offered a large observation field comparable to a transmission electron microscope and better magnification resolution than a classical scanning electron microscope.
Databáze: OpenAIRE
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