Autor:	J. Garnier, J.-M. Palau, C. Sudre, C. Detcheverry, J. Gasiot, Eric Lorfevre, Robert Ecoffet, C. Dachs, M.-C. Calvet
Rok vydání:	1998
Předmět:	Nuclear and High Energy Physics Nuclear Energy and Engineering Chemistry Power integrated circuits Electronic engineering Biophysics Substrate (chemistry) Heavy ion Electrical and Electronic Engineering
Zdroj:	IEEE Transactions on Nuclear Science. 45:1624-1627
ISSN:	1558-1578 0018-9499
Popis:	Heavy ion induced burnout is reported, for the first time, in different parts of a VIP. A 2D-simulation investigation allows a better understanding of this phenomenon and shows the importance of the epi-substrate junction parameters in the SEB occurrence.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0b64a1bae36c2efba2669ca6cc3e871c https://doi.org/10.1109/23.685250 Zobrazit plný text záznamu