MAST-SEY: MAterial Simulation Toolkit for Secondary Electron Yield. A monte carlo approach to secondary electron emission based on complex dielectric functions
| Autor: | M. P. Polak, Dane Morgan |
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| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
General Computer Science
Monte Carlo method General Physics and Astronomy FOS: Physical sciences 02 engineering and technology Dielectric Inelastic scattering 010402 general chemistry 01 natural sciences Secondary electrons General Materials Science Physics Elastic scattering Condensed Matter - Materials Science Materials Science (cond-mat.mtrl-sci) General Chemistry Computational Physics (physics.comp-ph) 021001 nanoscience & nanotechnology Physics - Plasma Physics 0104 chemical sciences Computational physics Plasma Physics (physics.plasm-ph) Computational Mathematics Mechanics of Materials Secondary emission Density of states Density functional theory 0210 nano-technology Physics - Computational Physics |
| Popis: | MAST-SEY is an open-source Monte Carlo code capable of calculating secondary electron emission using input data generated entirely from first principle (density functional theory) calculations. It utilizes the complex dielectric function and Penn’s theory for inelastic scattering processes, and relativistic Schrodinger theory by means of a partial-wave expansion method to govern elastic scattering. It allows the user to include explicitly calculated momentum dependence of the dielectric function, as well as to utilize first-principle density of states in secondary electron generation, which provides a more complete description of the underlying physics. In this paper we thoroughly describe the theoretical aspects of the modeling, as used in the code, and present sample results obtained for copper and aluminum. |
| Databáze: | OpenAIRE |
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