Scanning Kelvin Microscope: a new method for surface investigations

Autor:	R. Mäckel, J. Ren, H.-D. Liess, H. Baumgärtner
Rok vydání:	1995
Předmět:	Kelvin probe force microscope Microscope Chemistry business.industry Microstructure Biochemistry law.invention Analytical Chemistry Scanning probe microscopy Optics law Work function Scanning tunneling microscope business Volta potential Feature-oriented scanning
Zdroj:	Analytical and bioanalytical chemistry. 353(3-4)
ISSN:	1618-2650
Popis:	Based on the well known Kelvin probe for work function measurements a new microstructure analysis system - the Scanning Kelvin Microscope - has been developed. It allows to measure simultaneously with high lateral resolution the distribution of the contact potential difference (CPD) between a conductive sample and a reference probe together with the topographical structure of the sample surface. The measurement is contact free and non-destructive and can be carried out in natural environments. At present the lateral resolution of the measurement approaches 5 microm. The results can be displayed on a computer in three dimensional colour pictures.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0a9935e6a3952eabaa04d020eb4b9506 https://pubmed.ncbi.nlm.nih.gov/15048486 Zobrazit plný text záznamu Full text from SpringerLink