Comparative electron microprobe investigation of the Y-Ba-Cu-O thin films

Autor:	V. V. Rezvitskii, V.E. Fyodorov, B.A. Treiger, N.P. Dubinin, I. I. Bondarenko, L.A. Volkov, A.G. Amelichev, L. N. Mazalov, V.F. Vratskikh
Předmět:	Materials science genetic structures Relative intensity General Engineering Analytical chemistry chemistry.chemical_element Electron microprobe Electron Copper eye diseases chemistry K-alpha sense organs Thin film
Zdroj:	Scopus-Elsevier
Popis:	The results of electron probe investigation of the samples of Y-Ba-Cu-O thin films sputtered by different methods are presented. The regularities of the thin film growth are discussed. The relative intensity of copper L alpha to K alpha lines is proposed to be used for the comparison of the thicknesses of thin films.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0a573343319bd5fa98c631e77b4247b6 http://www.scopus.com/inward/record.url?eid=2-s2.0-44949287868&partnerID=MN8TOARS Zobrazit plný text záznamu