Near edge x-ray absorption fine structure spectroscopy with x-ray free-electron lasers
| Autor: | Yves Acremann, W. Wurth, William F. Schlotter, Alexander Föhlisch, F. Sorgenfrei, T. Beeck, A. Scherz, Joachim Stöhr, Mark H. Burkhardt, Annette Pietzsch, David P. Bernstein, Martin Beye |
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| Jazyk: | angličtina |
| Rok vydání: | 2009 |
| Předmět: | |
| Zdroj: | Applied physics letters 95, 134102 (2009). doi:10.1063/1.3236540 |
| DOI: | 10.1063/1.3236540 |
| Popis: | Applied physics letters 95, 134102 (2009). doi:10.1063/1.3236540 Published by American Institute of Physics, Melville, NY |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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