Impact of Bottom Electrode Integration on OxRAM Arrays Variability
| Autor: | M.-C. Cyrille, R. Crochemore, G. Molas, T. Magis, E. Nowak, Jean-Francois Nodin, A. Persico, J. Sandrini, N.-P. Tran, N. Castellani |
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| Přispěvatelé: | Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), European Project: 783176,WAKeMeUp |
| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Materials science
Annealing (metallurgy) business.industry Surface treatment Resistance chemistry.chemical_element Voltage measurement Surface finish Vapour deposition Annealing [SPI]Engineering Sciences [physics] chemistry Stack (abstract data type) Tin Electrode Optoelectronics Wafer [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics business Electrodes Voltage |
| Zdroj: | VLSI-TSA-2020 International Symposium on VLSI Technology, Systems and Applications VLSI-TSA-2020 International Symposium on VLSI Technology, Systems and Applications, Aug 2020, Hsinchu, Taiwan. pp.33-34, ⟨10.1109/VLSI-TSA48913.2020.9203694⟩ 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) |
| DOI: | 10.1109/VLSI-TSA48913.2020.9203694⟩ |
| Popis: | 978-1-7281-4232-6/20; International audience; HfO$_2$-based OxRAMs with various metal stacks in the inferior VIA of bottom electrode were fabricated. We demonstrated for the first time that the metal stack of TiN PVD (physical vapour deposition), followed by an annealing step decreases the standard error of the forming voltage by 10% compared to the other variants. The related die-to-die and cell-tocell variability is greatly reduced along the wafer diameter and the LRS shows better control of the tail bits at 3$\sigma$ of the distribution. The number of failed operations over 1e4 cycles for 1k cells is reduced by a factor 3, reaching a BER of 8e-5. Finally, correlation of the cell reliability with the bottom via roughness is discussed. |
| Databáze: | OpenAIRE |
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