Ultrafast x-ray measurement of laser heating in semiconductors: Parameters determining the melting threshold

Autor: Andrea Cavalleri, Jeff Squier, Ralph Jimenez, Klaus Sokolowski-Tinten, Cs. Toth, Kent R. Wilson, Craig W. Siders, M. Horn-von Hoegen, D. von der Linde, Christoph Rose-Petruck, Christopher P. J. Barty
Rok vydání: 2016
Předmět:
DOI: 10.1103/physrevb.63.193306
Popis: The pulse-width dependence of thermal melting and ablation thresholds in germanium and gallium arsenide is correlated to direct, ultrafast x-ray measurements of laser-heated depths. The heating dynamics, determined by the interplay of nonlinear optical absorption, delayed Auger heating, and high-density carrier diffusion, explain the scaling laws of thermal melting thresholds in different semiconductors.
Databáze: OpenAIRE
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