Spatially mapping charge carrier density and defects in organic electronics using modulation-amplified reflectance spectroscopy

Autor:	Janice Hudgings, Noam Katz, Lorelle N. Pye, Andrew R. Davis, Kenneth R. Carter
Rok vydání:	2014
Předmět:	Organic electronics Materials science business.industry Mechanical Engineering Spatially resolved Reflectance spectroscopy Transistor law.invention Charge-carrier density Mechanics of Materials Modulation law Optoelectronics Modulation spectroscopy General Materials Science business Spectroscopy
Zdroj:	Advanced materials (Deerfield Beach, Fla.). 26(26)
ISSN:	1521-4095
Popis:	Charge-modulated optical spectroscopy is used to achieve dynamic two-dimensional mapping of the charge-carrier distribution in poly(3-hexylthiophene) thin-film transistors. The resulting in-channel distributions evolve from uniformly symmetric to asymmetrically saturated as the devices are increasingly biased. Furthermore, physical, chemical, and electrical defects are spatially resolved in cases where their presence is not obvious from the device performance.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::099c354385d310a2b962d3e6e634652f https://pubmed.ncbi.nlm.nih.gov/24889350 Zobrazit plný text záznamu Plný text