Automation of measurements of photoelectric parameters of high-impedance semiconductor films
| Autor: | Bogdan Dzundza, V.V. Prokopiv, L.D. Yurchyshyn, T.M. Mazur |
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| Rok vydání: | 2018 |
| Předmět: |
Materials science
Computer program business.industry Photoconductivity Condensed Matter Physics lcsh:QC1-999 Microcontroller High impedance Semiconductor Electrical resistance and conductance Hardware_GENERAL Electrical resistivity and conductivity Optoelectronics General Materials Science Physical and Theoretical Chemistry business lcsh:Physics Electronic circuit |
| Zdroj: | Фізика і хімія твердого тіла, Vol 19, Iss 4, Pp 363-367 (2019) |
| ISSN: | 2309-8589 1729-4428 |
| Popis: | A method for measuring the electrical conductivity and photoconductivity of semiconductor films with high electrical resistance is described. An electric circuit is presented and a computer program is developed. That provides automation of measurements, registration and initial processing of data, the possibility of constructing timelines graphs for preliminary analysis of experimental data already in the process of measurement. Key words: electrical parameters, photoconductivity, automation, microcontroller. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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