Combining X-ray excited optical luminescence and X-ray absorption spectroscopy for correlative imaging on the nanoscale

Autor: Selwin Hageraats, Katrien Keune, William Fresquet, Jean Michel Laurent, Stefan Stanescu, Mathieu Thoury
Přispěvatelé: Institut photonique d'analyse non-destructive européen des matériaux anciens (IPANEMA), Muséum national d'Histoire naturelle (MNHN)-Université de Versailles Saint-Quentin-en-Yvelines (UVSQ)-Centre National de la Recherche Scientifique (CNRS)-Ministère de la Culture (MC), University of Amsterdam [Amsterdam] (UvA), Rijksmuseum Amsterdam (RMA), Synchrotron SOLEIL (SSOLEIL), Centre National de la Recherche Scientifique (CNRS), The Bennink Foundation, S&C overig (HIMS, FNWI), CC overig (HIMS, FNWI)
Jazyk: angličtina
Rok vydání: 2021
Předmět:
Zdroj: Journal of Synchrotron Radiation
Journal of Synchrotron Radiation, International Union of Crystallography, 2021, 28, pp.1858-1864. ⟨10.1107/S1600577521009450⟩
Journal of Synchrotron Radiation, 28(6), 1858-1864. International Union of Crystallography
ISSN: 0909-0495
1600-5775
DOI: 10.1107/S1600577521009450⟩
Popis: A multimodal spectral imaging technique is demonstrated that allows simultaneous acquisition of soft X-ray transmission and X-ray excited optical luminescence. The use of a Fresnel zone plate ensures a lateral resolution of the correlative spectral images of approximately 40 nm.
X-ray absorption and optical luminescence can both provide valuable but very different information on the chemical and physical properties of materials. Although it is known that the spectral characteristics of many materials are highly heterogeneous on the micro- and/or nanoscale, no methodology has so far been shown to be capable of spatially resolving both full X-ray absorption and X-ray excited optical luminescence (XEOL) spectra on the nanoscale in a correlative manner. For this purpose, the scanning transmission X-ray microscope at the HERMES beamline of the SOLEIL synchrotron was equipped with an optical detection system capable of recording high-resolution XEOL spectra using a 40 nm soft X-ray probe. The functionality of the system was demonstrated by analyzing ZnO powder dispersions — showing simultaneously the X-ray linear dichroism and XEOL behavior of individual submicrometric ZnO crystallites.
Databáze: OpenAIRE