Use of Ion Mobility Spectrometry To Determine Low Levels of Impurities in Gases
Autor: | Dheandhanoo S, Ketkar Sn |
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Rok vydání: | 2001 |
Předmět: | |
Zdroj: | Analytical Chemistry. 73:2554-2557 |
ISSN: | 1520-6882 0003-2700 |
DOI: | 10.1021/ac010132q |
Popis: | The use of ion mobility spectrometry (IMS) for the determination of trace moisture and oxygen in bulk nitrogen has been explored. IMS utilizes atmospheric pressure ionization to ionize trace impurities in the sample gas. Mobility differences between trace impurity ions are exploited to separate these ions. Our results indicate that an IMS can indeed be used to detect |
Databáze: | OpenAIRE |
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