A versatile Johansson-type tender x-ray emission spectrometer
| Autor: | Baxter Abraham, Alessandro Gallo, Rebecca Armenta, Thomas Kroll, A. Maciel, Craig P. Schwartz, A. Prado, D. Zhang, S. Nowak, Elisa Biasin, Dimosthenis Sokaras, David V. Day, Roberto Alonso-Mori, Tsu-Chien Weng, Angel T. Garcia-Esparza, Dennis Nordlund, Steven T. Christensen |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Diffraction Materials science Spectrometer Physics::Instrumentation and Detectors business.industry Resolution (electron density) X-ray Synchrotron radiation Radius 01 natural sciences 010305 fluids & plasmas Optics 0103 physical sciences Vacuum chamber business Instrumentation Emission Spectrometer |
| Zdroj: | The Review of scientific instruments. 91(3) |
| ISSN: | 1089-7623 |
| Popis: | We present a high energy resolution x-ray spectrometer for the tender x-ray regime (1.6–5.0 keV) that was designed and operated at Stanford Synchrotron Radiation Lightsource. The instrument is developed on a Rowland geometry (500 mm of radius) using cylindrically bent Johansson analyzers and a position sensitive detector. By placing the sample inside the Rowland circle, the spectrometer operates in an energy-dispersive mode with a subnatural line-width energy resolution (∼0.32 eV at 2400 eV), even when an extended incident x-ray beam is used across a wide range of diffraction angles (∼30° to 65°). The spectrometer is enclosed in a vacuum chamber, and a sample chamber with independent ambient conditions is introduced to enable a versatile and fast-access sample environment (e.g., solid/gas/liquid samples, in situ cells, and radioactive materials). The design, capabilities, and performance are presented and discussed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|