Modelling the characteristics of a photodetector in a DVD player
Autor: | Heinz-Jorg Schröder, Bohumil Hnilicka, Alina Voda |
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Přispěvatelé: | Laboratoire d'automatique de Grenoble (LAG), Université Joseph Fourier - Grenoble 1 (UJF)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique de Grenoble (INPG), Optical Business Unit (OBU), STMicroelectronics, ST Microelectronics, Voda, Alina |
Jazyk: | angličtina |
Rok vydání: | 2005 |
Předmět: |
Video player
Engineering DVD player [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Photodetector 02 engineering and technology 01 natural sciences 010309 optics Tracking error Cylindrical lens Error signal Light intensity distribution 0103 physical sciences Electrical and Electronic Engineering [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Instrumentation Simulation business.industry Astigmatic method Metals and Alloys 021001 nanoscience & nanotechnology Condensed Matter Physics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Curve fitting Focus error signal 0210 nano-technology business Focus (optics) |
Zdroj: | Sensors and Actuators A: Physical Sensors and Actuators A: Physical, Elsevier, 2005, 120, pp.494-506 |
ISSN: | 0924-4247 1873-3069 |
Popis: | 14 pages; International audience; This paper presents a new method for modelling the non-linear characteristics of a photodetector (so-called the S-curve) in a DVD player. The photodetector is used in the DVD player to generate the focus and tracking error signals, which in turn have to be controlled at the minimum levels. For focus error signal generation, an analytical and a numerical photodetector model are developed here, based on the astigmatic method and on opto-geometrical analysis. The influence of model parameters on the focus error signal is discussed. To estimate the unknown model parameters, a curve fitting method is applied, using measured data from an industrial DVD–video player developed in STMicroelectronics laboratories. Model quality is illustrated by a comparison with the real focus error signal. |
Databáze: | OpenAIRE |
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