High-speed alternative phase-extraction method for imaging array-coupled binary moiré interferometry

Autor:	J. Josiah Steckenrider, J. Scott Steckenrider
Rok vydání:	2015
Předmět:	Materials science Pixel business.industry Materials Science (miscellaneous) Phase (waves) Moiré pattern Binary pattern Industrial and Manufacturing Engineering Sinusoidal projection Interferometry Optics Duty cycle Business and International Management business Image resolution
Zdroj:	Applied optics. 54(30)
ISSN:	1539-4522
Popis:	An alternative phase-extraction methodology is presented for high-resolution moire analysis, in which the projected and imaged pattern is imaged by a charge-coupled device (CCD) array relatively spaced at three pixels per period. The profilometric method uses a photolithographically printed binary pattern with a 33.3% duty cycle symmetrically projected and imaged using telecentric lenses. The resulting surface height map reduces phase error by 33% when compared to conventional sinusoidal projection and extraction methods. The presented system has the ability to resolve surface features with a lateral resolution of
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::07fb099b0c05d7b2bc70fac82792194c https://pubmed.ncbi.nlm.nih.gov/26560395 Zobrazit plný text záznamu