Calibration-free quantitative surface topography reconstruction in scanning electron microscopy
| Autor: | J.Th.M. De Hosson, Vaclav Ocelik, E. T. Faber, Diego Martinez-Martinez, C. Mansilla |
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| Přispěvatelé: | Applied Physics |
| Rok vydání: | 2014 |
| Předmět: |
Surface (mathematics)
Digital image correlation Materials science Rotation Scanning electron microscope Stereoscopy law.invention Optics law Microscopy Calibration Instrumentation business.industry Morphometry SEM IMAGES Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Tilt (optics) SEM Perspective 3-DIMENSIONAL MORPHOMETRY business Rotation (mathematics) 3D |
| Zdroj: | Ultramicroscopy, 148, 31-41. ELSEVIER SCIENCE BV |
| ISSN: | 1879-2723 0304-3991 |
| Popis: | This work presents a new approach to obtain reliable surface topography reconstructions from 2D Scanning Electron Microscopy (SEM) images. In this method a set of images taken at different tilt angles are compared by means of digital image correlation (DlC). It is argued that the strength of the method lies in the fact that precise knowledge about the nature of the rotation (vector and/or magnitude) is not needed. Therefore, the great advantage is that complex calibrations of the measuring equipment are avoided. The paper presents the necessary equations involved in the methods, including derivations and solutions. The method is illustrated with examples of 3D reconstructions followed by a discussion on the relevant experimental parameters. (C) 2014 Elsevier B.V. All rights reserved |
| Databáze: | OpenAIRE |
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