Patents, R&D and lag effects: evidence from flexible methods for count panel data on manufacturing firms

Autor:	Shiferaw Gurmu, Fidel Perez-Sebastian
Rok vydání:	2008
Předmět:	Statistics and Probability Estimation Distributed lag Economics and Econometrics Lag Elasticity (data store) Count data models Manufacturing sector Panel analysis Mathematics (miscellaneous) Economics Econometrics Manufacturing firms Social Sciences (miscellaneous) Panel data
Zdroj:	Empirical Economics. 35:507-526
ISSN:	1435-8921 0377-7332
DOI:	10.1007/s00181-007-0176-8
Popis:	This paper investigates the relationship between patents and research and development expenditures using new longitudinal patent data at the firm level for the U.S. manufacturing sector from 1982 to 1992. The paper also develops a new class of count panel data models based on series expansion of the distribution of individual effects. Estimation results from various distributed lag and dynamic multiplicative panel count data models show that the contemporaneous relationship between patenting and R&D expenditures continues to be strong, accounting for over 60% of the total R&D elasticity. The lag effects are higher than have previously been found for the 1970s data.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::070ac12b515239be1d0ea55f2712ad10 https://doi.org/10.1007/s00181-007-0176-8 Zobrazit plný text záznamu Plný text ve formátu PDF