The effects of incident electron current density and temperature on the total electron emission yield of polycrystalline CVD diamond
| Autor: | Belhaj, Mohamed, Tondu, T, T, Inguimbert, V, Barroy, Pierre, Silva, François, Gicquel, Alix |
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| Přispěvatelé: | ONERA - The French Aerospace Lab [Palaiseau], ONERA-Université Paris Saclay (COmUE), STAE, Laboratoire d'Ingénierie des Matériaux et des Hautes Pressions (LIMHP), Université Paris 13 (UP13)-Institut Galilée-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2010 |
| Předmět: |
010302 applied physics
Yield (engineering) Acoustics and Ultrasonics Chemistry education 02 engineering and technology Chemical vapor deposition Electron Conductivity 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Space charge Fluence Surfaces Coatings and Films Electronic Optical and Magnetic Materials Secondary emission 0103 physical sciences Physical Sciences Atomic physics 0210 nano-technology Current density |
| Zdroj: | Journal of Physics D: Applied Physics Journal of Physics D: Applied Physics, IOP Publishing, 2010, 43 (13), pp.135303. ⟨10.1088/0022-3727/43/13/135303⟩ |
| ISSN: | 0022-3727 1361-6463 |
| Popis: | International audience; Effects of the temperature and the incident electron current density on the total electron emission yield (TEEY) of polycrystalline diamond deposited by chemical vapor deposition technique (CVD) were investigated at low electron beam fluence. It was found that the TEEY reversibly increases with the temperature and reversibly decreases with the current density. This behavior is explained on the basis of a dynamic completion between the holes accumulation which (positive space charge) that internally diminish the secondary electron (SE) emission and the thermally activated conductivity that tends to reduce the space charge formation. |
| Databáze: | OpenAIRE |
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