Advances in Large-Scale Metrology – Review and future trends
| Autor: | Robert Schmitt, Ben Richard Hughes, E. Morse, Frank Härtig, Gert Goch, Wolfgang Knapp, Alistair B. Forbes, Maurizio Galetto, Martin Peterek, William T. Estler |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
0209 industrial biotechnology
Engineering Management science business.industry Process (engineering) Mechanical Engineering Scale (chemistry) Modeling 02 engineering and technology Metrology 01 natural sciences Industrial and Manufacturing Engineering 010309 optics 020901 industrial engineering & automation Metrology Modeling Large Scale Metrology 0103 physical sciences Systems engineering Large Scale Metrology business |
| Zdroj: | CIRP Annals. 65:643-665 |
| ISSN: | 0007-8506 |
| DOI: | 10.1016/j.cirp.2016.05.002 |
| Popis: | The field of Large-Scale Metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration. A primary reason that Large-Scale Metrology continues to represent the research frontier is that technological advances introduced and perfected at a conventional scale face additional challenges which increase non-linearly with size. This necessitates new ways of considering the entire measuring process, resulting in the application of concepts such as virtual measuring processes and cyber-physical systems. This paper reports on the continuing evolution of Large-Scale Metrology. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect