High-resolution MFM: Simulation of tip sharpening
| Autor: | A.G. van den Bos, H. Saito, J.C. Lodder, Leon Abelmann |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
Physics
magnetic tips SMI-EXP: EXPERIMENTAL TECHNIQUES business.industry Resolution (electron density) High resolution Sharpening SMI-TST: From 2006 in EWI-TST Ellipsoid Signal Electronic Optical and Magnetic Materials Magnetic force microscopy (MFM) Optics METIS-212078 EWI-5632 Resolution TST-MFM: Magnetic Force Microscope TST-uSPAM: micro Scanning Probe Array Memory Electrical and Electronic Engineering Magnetic force microscope business IR-45378 Simulation |
| Zdroj: | IEEE transactions on magnetics, 39(5), 3447-3449. IEEE |
| ISSN: | 0018-9464 |
| DOI: | 10.1109/tmag.2003.816178 |
| Popis: | The transfer functions of tips with various sharpened tip ends were calculated and the resolution of these tips was estimated by considering the resolution limit due to thermal noise at room temperature. The tip having an ellipsoidal tip end (ellipsoidal tip) is found to be a suitable candidate for high-resolution magnetic force microscopy. Sharpening of the flat tip end makes zero signal frequencies disappear for tips with ellipticities larger than tan45/spl deg/. The sensitivity shows a maximum around an ellipticity of tan80/spl deg/. The ellipsoidal tip shows a much smaller tip thickness dependence compared to the tip having a flat tip end because only the tip end mainly contributes to signals in case of the ellipsoidal tip. |
| Databáze: | OpenAIRE |
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