Evaluating Young's Modulus of Single Yeast Cells Based on Compression Using an Atomic Force Microscope with a Flat Tip
| Autor: | Nobuyuki Uozumi, Hisataka Maruyama, Chihiro Uehara, Takahiro Hirate, Fumihito Arai, Di Chang |
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| Rok vydání: | 2021 |
| Předmět: |
Cantilever
Materials science Atomic force microscopy technology industry and agriculture Modulus Stiffness Young's modulus Cell Count Saccharomyces cerevisiae Compression (physics) Microscopy Atomic Force Yeast symbols.namesake Microfluidic chip Elastic Modulus medicine symbols medicine.symptom Composite material Instrumentation |
| Zdroj: | Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 27(2) |
| ISSN: | 1435-8115 |
| Popis: | In this research, atomic force microscopy (AFM) with a flat tip cantilever is utilized to measure Young's modulus of a whole yeast cell (Saccharomyces cerevisiae BY4741). The results acquired from AFM are similar to those obtained using a microfluidic chip compression system. The mechanical properties of single yeast cells are important parameters which can be examined using AFM. Conventional studies apply AFM with a sharp cantilever tip to indent the cell and measure the force-indentation curve, from which Young's modulus can be calculated. However, sharp tips introduce problems because the shape variation can lead to a different result and cannot represent the stiffness of the whole cell. It can lead to a lack of broader meaning when evaluating Young's modulus of yeast cells. In this report, we confirm the differences in results obtained when measuring the compression of a poly(dimethylsiloxane) bead using a commercial sharp tip versus a unique flat tip. The flat tip effectively avoids tip-derived errors, so we use this method to compress whole yeast cells and generate a force–deformation curve. We believe our proposed method is effective for evaluating Young's modulus of whole yeast cells. |
| Databáze: | OpenAIRE |
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