Isothermal close space sublimation for II-VI semiconductor filling of porous matrices

Autor: Claudia de Melo, Aurelio Climent-Font, Osvaldo de Melo, Fernando Argulló-Rueda, Vicente Torres-Costa
Přispěvatelé: UAM. Departamento de Física Aplicada
Rok vydání: 2012
Předmět:
Zdroj: Digital.CSIC. Repositorio Institucional del CSIC
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Biblos-e Archivo. Repositorio Institucional de la UAM
Nanoscale Research Letters
DOI: 10.1186/1556-276X-7-409
Popis: Isothermal close space sublimation, a simple and low-cost physical vapour transport technique, was used to infiltrate ZnTe and CdSe semiconductors in porous silicon. The structure of the embedded materials was determined by X-ray diffraction analysis while Rutherford backscattering spectra allowed determining the composition profiles of the samples. In both cases, a constant composition of the II-VI semiconductors throughout the porous layer down to the substrate was found. Resonance Raman scattering of the ZnTe samples indicates that this semiconductor grows in nanostructured form inside the pores. Results presented in this paper suggest that isothermal close space sublimation is a promising technique for the conformal growth of II-VI semiconductors in porous silicon.
Osvaldo de Melo and Vicente Torres-Costa acknowledge the support given by the agreement between the University of Havana and the Autonomous University of Madrid. Research funding has been provided by projects MAT2008-06858-C02-02 (Spain) and Consolider FUNCOAT CSD2008-00023 (Spain).
Databáze: OpenAIRE