RF Reflectometry for Readout of Charge Transition in a Physically Defined PMOS Silicon Quantum Dot
| Autor: | Kimihiko Kato, Sinan Bugu, Tetsuo Kodera, Shimpei Nishiyama, Yongxun Liu, Takahiro Mori |
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| Rok vydání: | 2020 |
| Předmět: |
Materials science
Physics and Astronomy (miscellaneous) Condensed Matter - Mesoscale and Nanoscale Physics business.industry Silicon quantum dots General Engineering General Physics and Astronomy FOS: Physical sciences Charge (physics) Hardware_PERFORMANCEANDRELIABILITY PMOS logic P channel Quantum dot Mesoscale and Nanoscale Physics (cond-mat.mes-hall) Hardware_INTEGRATEDCIRCUITS Optoelectronics business Reflectometry |
| DOI: | 10.48550/arxiv.2010.07566 |
| Popis: | We have embedded a physically defined p-channel silicon MOS quantum dot (QD) device into an impedance transformer RC circuit. To decrease the parasitic capacitance and surpass the cutoff frequency of the device which emerges in MOS devices that have a top gate and act as RC low-pass filter, we fabricate a new device to reduce the device's top gate area from 400 $\mbox{$\mu$m}^2$ to 0.09 $\mbox{$\mu$m}^2$. Having a smaller top gate eliminates the cutoff frequency problem preventing the RF signal from reaching QD. We show that we have fabricated a single QD properly, which is essential for RF single-electron transistor technique. We also analyze and improve the impedance matching condition and show that it is possible to perform readout of charge transition at 4.2 K by RF reflectometry, which will get us to fast readout of charge and spin states. Comment: 11 pages, 6 figures |
| Databáze: | OpenAIRE |
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