SAW tomography-spatially resolved charge detection by SAW in semiconductor structures for imaging applications

Autor: M. Streibl, Achim Wixforth, C. Kadow, Florian W. Beil, A. C. Gossard
Rok vydání: 1999
Předmět:
Zdroj: 1999 IEEE Ultrasonics Symposium. Proceedings. International Symposium (Cat. No.99CH37027).
DOI: 10.1109/ultsym.1999.849346
Popis: The interaction of surface acoustic waves and free carriers in a nearby semiconducting sheet yields an extremely sensitive method for sensing electrical and optical signals. In the present work we demonstrate the spatially resolved detection of optical signals with a spatial resolution of a few acoustic wavelengths. We exploit the high selectivity of so-called tapered transducers to excite adjustable narrow acoustic beams allowing for the scanning of photogenerated charge distributions. Using a special layout, both x and y-coordinate of the optical signal are readily read out in a single frequency sweep. Complex 2D image information can be gathered when a tomographic imaging technique is applied.
Databáze: OpenAIRE