High-resolution error detection in the capture process of a single-electron pump
| Autor: | Masaya Kataoka, Gac Jones, A. Petrie, Stephen P. Giblin, Patrick See, David A. Ritchie, J. Griffiths, Ian Farrer, Tjbm Janssen |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
Physics
Physics and Astronomy (miscellaneous) Condensed Matter - Mesoscale and Nanoscale Physics Noise (signal processing) Electron capture business.industry Quantum point contact FOS: Physical sciences Charge (physics) 02 engineering and technology Electron 021001 nanoscience & nanotechnology Condensed Matter::Mesoscopic Systems and Quantum Hall Effect 01 natural sciences Computational physics Semiconductor 0103 physical sciences Mesoscale and Nanoscale Physics (cond-mat.mes-hall) Rectangular potential barrier 010306 general physics 0210 nano-technology Electron counting business |
| ISSN: | 0003-6951 |
| Popis: | The dynamic capture of electrons in a semiconductor quantum dot (QD) by raising a potential barrier is a crucial stage in metrological quantized charge pumping. In this work, we use a quantum point contact (QPC) charge sensor to study errors in the electron capture process of a QD formed in a GaAs heterostructure. Using a two-step measurement protocol to compensate for $1/f$ noise in the QPC current, and repeating the protocol more than $10^{6}$ times, we are able to resolve errors with probabilities of order $10^{-6}$. For the studied sample, one-electron capture is affected by errors in $\sim30$ out of every million cycles, while two-electron capture was performed more than $10^6$ times with only one error. For errors in one-electron capture, we detect both failure to capture an electron, and capture of two electrons. Electron counting measurements are a valuable tool for investigating non-equilibrium charge capture dynamics, and necessary for validating the metrological accuracy of semiconductor electron pumps. 5 pages, 4 figures |
| Databáze: | OpenAIRE |
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