Surface Layering in Liquid Gallium: An X-Ray Reflectivity Study

Autor:	Olaf M. Magnussen, Peter S. Pershan, M. J. Regan, Moshe Deutsch, E. H. Kawamoto, Benjamin M. Ocko, Lonny E. Berman, Sangyoub Lee, N. Maskil
Rok vydání:	1995
Předmět:	X-ray spectroscopy Electron density Materials science Characteristic length business.industry General Physics and Astronomy chemistry.chemical_element Molecular physics X-ray reflectivity Amplitude Optics chemistry Layering Gallium Supercooling business
Zdroj:	Physical Review Letters. 75:2498-2501
ISSN:	1079-7114 0031-9007
DOI:	10.1103/physrevlett.75.2498
Popis:	Surface-induced atomic layering in liquid gallium has been observed using x-ray reflectivity, ultrahigh vacuum conditions, and sputtered clean surfaces. Reflectivity data, collected on a supercooled liquid sample to momentum transfers as large as {ital q}{sub {ital z}}=3.0 A{sup {minus}1}, exhibit a strong maximum near 2.4 A{sup {minus}1} indicating a layer spacing that is comparable to its atomic dimensions. The amplitude of the electron density oscillations decays with a characteristic length of 6 A. This is unexpectedly twice that of recent results for Hg, and the difference may be related to covalent bonding or supercooling.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::037da07a5e9d2d39fb946400b8fcbc33 https://doi.org/10.1103/physrevlett.75.2498 Zobrazit plný text záznamu