Towards atomically resolved EELS elemental and fine structure mapping via multi-frame and energy-offset correction spectroscopy
| Autor: | Peter A. van Aken, Wilfried Sigle, Kersten Hahn, Yi Wang, Michael R. S. Huang, Ute Salzberger |
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| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Offset (computer science) Chemistry business.industry Superlattice Nanotechnology 02 engineering and technology Electron 021001 nanoscience & nanotechnology 01 natural sciences Atomic and Molecular Physics and Optics Spectral line Electronic Optical and Magnetic Materials Multi frame Structure mapping 0103 physical sciences Scanning transmission electron microscopy Optoelectronics 0210 nano-technology Spectroscopy business Instrumentation |
| Zdroj: | Ultramicroscopy. 184 |
| ISSN: | 1879-2723 |
| Popis: | Electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are two of the most common means for chemical analysis in the scanning transmission electron microscope. The marked progress of the instrumentation hardware has made chemical analysis at atomic resolution readily possible nowadays. However, the acquisition and interpretation of atomically resolved spectra can still be problematic due to image distortions and poor signal-to-noise ratio of the spectra, especially for investigation of energy-loss near-edge fine structures. By combining multi-frame spectrum imaging and automatic energy-offset correction, we developed a spectrum imaging technique implemented into customized DigitalMicrograph scripts for suppressing image distortions and improving the signal-to-noise ratio. With practical examples, i.e. SrTiO 3 bulk material and Sr-doped La 2 CuO 4 superlattices, we demonstrate the improvement of elemental mapping and the EELS spectrum quality, which opens up new possibilities for atomically resolved EELS fine structure mapping. |
| Databáze: | OpenAIRE |
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