Distortions to the penetration depth and coherence length of superconductor/normal-metal superlattices
Autor: | Julie A. Borchers, Reza Loloee, Norman O. Birge, Gavin Burnell, Patrick Quarterman, Nathan Satchell, Brian J. Kirby |
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Rok vydání: | 2020 |
Předmět: |
Superconductivity
Josephson effect Materials science Physics and Astronomy (miscellaneous) Condensed matter physics Superlattice Condensed Matter - Superconductivity London penetration depth FOS: Physical sciences 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter::Mesoscopic Systems and Quantum Hall Effect 01 natural sciences Coherence length Superconductivity (cond-mat.supr-con) Condensed Matter::Materials Science Condensed Matter::Superconductivity 0103 physical sciences General Materials Science Neutron reflectometry Thin film 010306 general physics 0210 nano-technology Penetration depth |
ISSN: | 2475-9953 |
DOI: | 10.48550/arxiv.2001.09310 |
Popis: | Superconducting ($S$) thin film superlattices composed of Nb and a normal metal spacer ($N$) have been extensively utilized in Josephson junctions given their favorable surface roughness compared to Nb films of comparable thickness. In this work, we characterize the London penetration depth and Ginzburg-Landau coherence lengths of $S/N$ superlattices using polarized neutron reflectometry and electrical transport. Despite the normal metal spacer layers being only approximately 8% of the total superlattice thickness, we surprisingly find that the introduction of these thin $N$ spacers between $S$ layers leads to a dramatic increase in the measured London penetration depth compared to that of a single Nb film of comparable thickness. Using the measured values for the effective in- and out-of-plane coherence lengths, we quantify the induced anisotropy of the superlattice samples and compare to a single Nb film sample. From these results, we find that that the superlattices behave similarly to layered 2D superconductors. Comment: 9 pages, 3 figures main text and 7 pages, 5 figures supplemental materials |
Databáze: | OpenAIRE |
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