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The influence of SEU and SEFI events in 4-Gbit DDR3 SDRAM on the data integrity of an example mass memory with a capacity of 4-Tbit and Single Symbol Error Correcting Reed-Solomon Code is investigated. Index Terms Bit Error Rate, DDR3 SDRAM, Error Correction, Mass Memory, Mean Time To First Error, ReedSolomon, SEE, SEFI, SEU Corresponding author: Dietmar Walter, Technische Universitat Braunschweig, Institut f. Datentechnik, Hans-Sommer-Str. 66, 38106 Braunschweig, Germany, Phone +49 531 391 9672, Fax +49 531 391 4587, Email: walter@ida.ing.tu-bs.de Contributing authors: Martin Herrmann, Technische Universitat Braunschweig, Institut f. Datentechnik, Hans-Sommer-Str. 66, 38106 Braunschweig, Germany, Phone +49 531 391 9679, Fax +49 531 391 4587, Email: mherrmann@ida.ing.tu-bs.de Kai Grurmann, Technische Universitat Braunschweig, Institut f. Datentechnik, Hans-Sommer-Str. 66, 38106 Braunschweig, Germany, Phone +49 531 391 3741, Fax +49 531 391 4587, Email: gruermann@ida.ing.tu-bs.de Fritz Gliem, Technische Universitat Braunschweig, Institut f. Datentechnik, Hans-Sommer-Str. 66, 38106 Braunschweig, Germany, Phone +49 531 391 3740, Fax +49 531 391 4587, Email: gliem@ida.ing.tu-bs.de Technical Topic: SEE Effects on Systems Preferred Presentation Type: Oral Presentation in Session J (SEE Effects on Systems) This research has been supported by the European Space Agency, ESA-ESTEC, under contracts No 4200021711/08/NL/PA and 4000101358/10/NL/AF, and by the German Space Agency, DLR, under contract No FKZ 50 FM0707. |
