Microstructure and Chemistry of Annealed Al–Cu–Fe–Cr Quasicrystalline Approximant Coatings
| Autor: | Jeffrey S. Zabinski, Chris R. M. Grovenor, M.J. Daniels, J. C. Bilello, Houzheng Wu |
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| Rok vydání: | 2005 |
| Předmět: |
Materials science
Argon Photoemission spectroscopy Annealing (metallurgy) Mechanical Engineering Metallurgy Analytical chemistry Quasicrystal chemistry.chemical_element Condensed Matter Physics Microstructure Amorphous solid chemistry Mechanics of Materials Sputtering Transmission electron microscopy General Materials Science |
| Zdroj: | Journal of Materials Research. 20:176-182 |
| ISSN: | 2044-5326 0884-2914 |
| DOI: | 10.1557/jmr.2005.0022 |
| Popis: | An as-deposited Al–Cu–Fe–Cr film was annealed in flowing argon to study development of a quasicrystalline approximant microstructure. Sputter profile x-ray photoemission spectroscopy analysis showed oxygen incorporation reached approximately 70 at.% at the surface of the film, declined monotonically, and stabilized at ∼10 at.% at a depth of 160 nm. Synchrotron grazing incidence x-ray scattering was used to probe the structure of the coating at various penetration depths by altering the angle of the incident x-ray beam. An amorphous structure was observed near the termination surface, which coexisted with a compressively strained crystalline aluminum. These phases were the dominant microstructure to a depth of 110 nm. Below 150 nm, the film was primarily O1 decagonal approximant. Cross-section transmission electron microscopy elucidated a columnar growth morphology with associated porosity in the interstices between the columns. The resulting development of the Al–Cu–Fe–Cr decagonal approximant coatings from the precursor is reported. |
| Databáze: | OpenAIRE |
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