Structural and electronic properties of the pure and stable elemental 3D topological Dirac semimetal $\alpha$-Sn

Autor: Pin-Cheng Lin, Harsh Bana, Umamahesh Thupakula, Sara Gonzalez, Chris Van Haesendonck, Luca Petaccia, L. M. C. Pereira, Maya N. Nair, Margriet J. Van Bael, Ivan Madarevic, Niels Claessens, Gertjan Lippertz, Giovanni Di Santo
Jazyk: angličtina
Rok vydání: 2019
Předmět:
Technology
INSB(100)
Materials science
Photoemission spectroscopy
lcsh:Biotechnology
Scanning tunneling spectroscopy
Materials Science
BETA
Materials Science
Multidisciplinary

02 engineering and technology
Electronic structure
Topology
01 natural sciences
law.invention
Physics
Applied

symbols.namesake
Condensed Matter::Materials Science
law
lcsh:TP248.13-248.65
0103 physical sciences
General Materials Science
Nanoscience & Nanotechnology
GROWTH-MORPHOLOGY
010302 applied physics
Condensed Matter - Materials Science
Science & Technology
Dopant
STABILITY
Physics
Fermi level
General Engineering
021001 nanoscience & nanotechnology
Semimetal
lcsh:QC1-999
3. Good health
SURFACE OXIDATION
Physical Sciences
MOSSBAUER
symbols
Science & Technology - Other Topics
Scanning tunneling microscope
0210 nano-technology
TRANSITION
lcsh:Physics
Molecular beam epitaxy
Zdroj: APL Materials, Vol 8, Iss 3, Pp 031114-031114-7 (2020)
Popis: In-plane compressively strained $\alpha$-Sn films have been theoretically predicted and experimentally proven to possess non-trivial electronic states of a 3D topological Dirac semimetal. The robustness of these states typically strongly depends on purity, homogeneity and stability of the grown material itself. By developing a reliable fabrication process, we were able to grow pure strained $\alpha$-Sn films on InSb(100), without heating of the substrate during growth, nor using any dopants. The $\alpha$-Sn films were grown by molecular beam epitaxy, followed by experimental verification of the achieved chemical purity and structural properties of the film's surface. Local insight into the surface morphology was provided by scanning tunneling microscopy. We detected the existence of compressive strain using M\"ossbauer spectroscopy and we observed a remarkable robustness of the grown samples against ambient conditions. The topological character of the samples was confirmed by angle-resolved photoemission spectroscopy, revealing the Dirac cone of the topological surface state. Scanning tunneling spectroscopy, moreover, allowed obtaining an improved insight into the electronic structure of the 3D topological Dirac semimetal $\alpha$-Sn above the Fermi level.
Comment: APM19-AR-01221R
Databáze: OpenAIRE