Nanoscale Insights into the Structure of Solution-processed Graphene by X-ray scattering

Autor: Zhengyu Yan, María J G Guimarey, Khaled Parvez, Chaochao Dun, Oliver Read, Thomas Forrest, Jeffrey J Urban, Amor Abdelkader, Cinzia Casiraghi, Wajira Mirihanage
Jazyk: angličtina
Rok vydání: 2022
Předmět:
Zdroj: Yan, Z, Guimarey, M J G, Parvez, K, Dun, C, Read, O, Forrest, T, Urban, J J, Abdelkader, A, Casiraghi, C & Mirihanage, W 2022, ' Nanoscale Insights into the Structure of Solution-processed Graphene by X-ray scattering ', 2D Materials, vol. 10, 015006 . https://doi.org/10.1088/2053-1583/ac9b6f
2D Materials, vol 10, iss 1
Popis: Chemical exfoliation is an attractive approach for the synthesis of graphene due to its low cost and simplicity. However, challenges still remain in the characterization of solution-processed graphene, in particular with atomic resolution. Through this work we demonstrate the x-ray pair distribution function as a novel approach to study solution-processed graphene or other 2D materials with atomic resolution, directly in solution, produced by liquid-phase and electrochemical exfoliations. The results show the disappearance of long-range atomic correlations, in both cases, confirming the production of single and few-layer graphene. In addition, a considerable ring distortion has been observed as compared to graphite, irrespective of the solvent used: the normal surface angle to the sheet of the powder sample should be less than 6°, compatible with ripples formation observed in suspended graphene. We attribute this effect to the interaction of solvent molecules with the graphene nanosheets.
Databáze: OpenAIRE