Quest for Soft X-ray Tomographic Ptychography using KB focusing Optics

Autor:	Yen-Yi Chu, Singh Amol, Hung-Wei Shiu, Lo-Yueh Chang, Di-Jing Huang, Tolek Tyliszczak
Rok vydání:	2018
Předmět:	Soft x ray Materials science Optics 010304 chemical physics business.industry 0103 physical sciences 010306 general physics business 01 natural sciences Instrumentation Ptychography
Zdroj:	Microscopy and Microanalysis. 24:60-63
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927618012722
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ffe86e7475ce1245200559bbd74ee1bd https://doi.org/10.1017/s1431927618012722 Zobrazit plný text záznamu