Heavy ion and proton induced single event transients in comparators
| Autor: | James R. Coss, D. K. Nichols, H.R. Schwartz, T.F. Miyahira |
|---|---|
| Rok vydání: | 1996 |
| Předmět: |
Physics
Nuclear and High Energy Physics Comparator Proton business.industry Electrical engineering Pulse duration High voltage Amplitude Nuclear Energy and Engineering Physics::Accelerator Physics Transient response Transient (oscillation) Electrical and Electronic Engineering Atomic physics business Event (particle physics) |
| Zdroj: | IEEE Transactions on Nuclear Science. 43:2960-2967 |
| ISSN: | 1558-1578 0018-9499 |
| DOI: | 10.1109/23.556892 |
| Popis: | This paper presents a display of heavy-ion- and proton-induced single event transients for three comparators. The transient vital signs are serious: low LET threshold, very high voltage amplitude and extended pulse duration (microsecs.). |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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