| Autor: |
Mario B. Viani, Mark A. Wendman, D. A. Walters, Paul K. Hansma, George T. Paloczi, Tilman E. Schaeffer, Jason Cleveland, Virgil B. Elings, G. Gurley |
| Rok vydání: |
1997 |
| Předmět: |
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| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| Popis: |
We have applied a new generation of short cantilevers with high resonant frequencies to tapping mode atomic force microscopy of a process in situ. Crystal growth in the presence of protein has been imaged stably at 79 lines/s (1.6 s/image), using a 26 micrometers long cantilever with a spring constant of 0.66 N/m at a tapping frequency of 90.9 kHz. This high scan speed nearly eliminated distortion in the step edge motion and allowed imaging of finer features along the step edges. Atomic force microscopy with short cantilevers therefore allows higher resolution imaging of crystal growth in space as well as time.© (1997) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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