Ultrafast Transmission Electron Microscopy: Techniques and Applications

Autor:	John Roehling, Eric Montgomery, Darrin Leonhardt
Rok vydání:	2021
Předmět:	General Computer Science Transmission electron microscopy Computer science Nanotechnology High-resolution transmission electron microscopy Ultrashort pulse Technology review
Zdroj:	Microscopy Today. 29:46-54
ISSN:	2150-3583 1551-9295
DOI:	10.1017/s1551929521001140
Popis:	With the growing applications of temporally resolved electron microscopy for probing basic phenomena and reducing beam-induced damage, a multifaceted introduction to the field of ultrafast transmission electron microscopy is provided. This primer includes techniques and equipment as well as implementation perspectives. Historical developments and recent technical advances will provide insight into ultrafast capabilities for research as well as educate electron microscopists on the general techniques. This technology review also includes applications enabled by ultrafast techniques using various sample stimuli from multidisciplinary fields.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ff4f5afa3f2ca51931605e2452ed44a0 https://doi.org/10.1017/s1551929521001140 Zobrazit plný text záznamu Plný text ve formátu PDF Plný text ve formátu HTML
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