Two-Dimensional Ultrahigh-Density X-ray Optical Memory
| Autor: | Petros H. Bezirganyan, Siranush E. Bezirganyan, Hakob P. Bezirganyan, Hayk H. Bezirganyan |
|---|---|
| Rok vydání: | 2007 |
| Předmět: |
3D optical data storage
Materials science business.industry Biomedical Engineering Bioengineering Semiconductor memory General Chemistry Condensed Matter Physics Numerical aperture Non-volatile memory Nanolithography Optics General Materials Science business Reflectometry Lithography Computer memory |
| Zdroj: | Journal of Nanoscience and Nanotechnology. 7:306-315 |
| ISSN: | 1533-4880 |
| DOI: | 10.1166/jnn.2007.18027 |
| Popis: | Most important aspect of nanotechnology applications in the information ultrahigh storage is the miniaturization of data carrier elements of the storage media with emphasis on the long-term stability. Proposed two-dimensional ultrahigh-density X-ray optical memory, named X-ROM, with long-term stability is an information carrier basically destined for digital data archiving. X-ROM is a semiconductor wafer, in which the high-reflectivity nanosized X-ray mirrors are embedded. Data are encoded due to certain positions of the mirrors. Ultrahigh-density data recording procedure can e.g., be performed via mask-less zone-plate-array lithography (ZPAL), spatial-phase-locked electron-beam lithography (SPLEBL), or focused ion-beam lithography (FIB). X-ROM manufactured by nanolithography technique is a write-once memory useful for terabit-scale memory applications, if the surface area of the smallest recording pits is less than 100 nm2. In this case the X-ROM surface-storage capacity of a square centimetre becomes by two orders of magnitude higher than the volumetric data density really achieved for three-dimensional optical data storage medium. Digital data read-out procedure from proposed X-ROM can e.g., be performed via glancing-angle incident X-ray micro beam (GIX) using the well-developed X-ray reflectometry technique. In presented theoretical paper the crystal-analyser operating like an image magnifier is added to the set-up of X-ROM data handling system for the purpose analogous to case of application the higher numerical aperture objective in optical data read-out system. We also propose the set-up of the X-ROM read-out system based on more the one incident X-ray micro beam. Presented scheme of two-beam data handling system, which operates on two mutually perpendicular well-collimated monochromatic incident X-ray micro beams, essentially increases the reliability of the digital information read-out procedure. According the graphs of characteristic functions presented in paper, one may choose optimally the incident radiation wavelength, as well as the angle of incidence of X-ray micro beams, appropriate for proposed digital data read-out procedure. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|