Thickness dependent electrical resistivity in amorphous Mg-Zn-Ca thin films

Autor:	D.X. Zhang, J.Z. Jiang, Yingnan Fu, X.D. Wang, Q.P. Cao
Rok vydání:	2019
Předmět:	Thickness dependent Materials science Scattering Electrical resistivity and conductivity Materials Chemistry Metals and Alloys Surfaces and Interfaces Composite material Thin film Diffraction model Surfaces Coatings and Films Electronic Optical and Magnetic Materials Amorphous solid
Zdroj:	Thin Solid Films. 672:182-185
ISSN:	0040-6090
DOI:	10.1016/j.tsf.2019.01.026
Popis:	Electrical resistivity in amorphous Mg65Zn30Ca5 thin films with thicknesses ranging from 49 nm to 1786 nm is investigated by four-probe method at 4–300 K. It is revealed that for thickness from 94 nm to 1786 nm the Ziman-Faber diffraction model can describe temperature-dependent electrical resistivity, while for 49 nm-thick film the two-level system scattering mechanism is validated below 40 K and Ziman-Faber diffraction model above 40 K. More interface fraction between the columnar structures with enhanced heterogeneity could be the possible origin of two-level system scattering in thinnest film, instead of denser atomic packing.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::fef4dc8e8c96a8b4015e60de11cfe886 https://doi.org/10.1016/j.tsf.2019.01.026 Zobrazit plný text záznamu Full Text from ScienceDirect