A new test vehicle for RRAM array characterization
| Autor: | J-F. Nodin, G. Reimbold, L. Kadura, C. Cagli, C. Nguyen, S. Bernasconi |
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| Rok vydání: | 2017 |
| Předmět: |
Engineering
Resistive touchscreen business.industry Electrical engineering 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Characterization (materials science) Resistive random-access memory Electronic engineering 0210 nano-technology business Random access Voltage |
| Zdroj: | 2017 International Conference of Microelectronic Test Structures (ICMTS). |
| Popis: | In this paper we present a new test vehicle designed for Resistive Random Access Memories (RRAM) arrays (from single bit to 1Mbits) characterization. The arrays structure, the decoders, and the selectors are explained as well as the electrical setup that drives the array decoders and performs the electrical characterization. Eventually, we discuss some electrical results concerning the switching voltage variability and show the performance of the test vehicle. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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