Influence of trap densities in ITO thin film on the optical, electrical, and surface plasmon resonance properties

Autor:	M Anjitha, E Sharika, Varsha T. Babu, Niveditha Nair, K Arya, Sanjay K. Ram, M Meenu, Pooja Sanjeev
Rok vydání:	2021
Předmět:	Trap (computing) History Materials science business.industry Optoelectronics Thin film Surface plasmon resonance business Computer Science Applications Education
Zdroj:	Journal of Physics: Conference Series. 2070:012020
ISSN:	1742-6596 1742-6588
DOI:	10.1088/1742-6596/2070/1/012020
Popis:	Indium–tin–oxide (ITO) is a material having metallic behavior in the infra-red spectral range. Its electrical and optical properties are also easily tuned, making it a suitable alternative plasmonic material in the infra-red region. In this work, electrical and optical simulation modeling was performed to study the effect of trap densities in different carrier scattering mechanisms on the mobility in ITO. This study correlates the micro-structural and opto-electronic parameters to the surface plasmon resonance (SPR) behavior in the ITO thin films. The results indicate that low defect density with high carrier concentration can provide better SPR performance in ITO.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::fe7210ee4cda56f0308992d604c9ac9d https://doi.org/10.1088/1742-6596/2070/1/012020 Zobrazit plný text záznamu