Contrast inversion in nc-AFM on Si(111)7×7 due to short-range electrostatic interactions

Autor:	Ch. Loppacher, M. Bammerlin, Roland Bennewitz, Alexis Baratoff, S. Schär, V. Barwich, Ernst Meyer, M. Guggisberg, Oliver Pfeiffer
Rok vydání:	2001
Předmět:	Positive sample Condensed matter physics Chemistry Atomic force microscopy Analytical chemistry Frequency shift General Materials Science Inversion (meteorology) General Chemistry Negative bias Electrostatics
Zdroj:	Applied Physics A. 72:S19-S22
ISSN:	1432-0630 0947-8396
DOI:	10.1007/s003390100629
Popis:	Contrast inversion in nc-AFM on Si(111)7×7 is observed at positive sample bias. Corner holes appear as protrusions and adatoms as holes. The application of negative bias voltages causes drastic changes in the atomic constrast. Frequency shift vs distance curves show evidence of short-range, voltage-dependent forces. These observations indicate that short-range electrostatic forces are important for atomic-scale contrast in nc-AFM.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::fe50f6da391584089d3452bf26d63172 https://doi.org/10.1007/s003390100629 Zobrazit plný text záznamu Plný text ve formátu PDF