Microscopic Optical Beam Profile Measurement Technique for Near-Infrared Light by Using a Scanning Thermal Probe
| Autor: | Woongkyu Park, Sangjoon Cho, Soo Bong Choi, Hyun-Tae Kim, Cheolsu Kim |
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| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Diffraction Materials science business.industry Photothermal effect Near-infrared spectroscopy Resolution (electron density) Physics::Optics General Physics and Astronomy 02 engineering and technology Scanning thermal microscopy 021001 nanoscience & nanotechnology 01 natural sciences Optics 0103 physical sciences Microscopy Physics::Accelerator Physics 0210 nano-technology business Beam (structure) Diode |
| Zdroj: | Journal of the Korean Physical Society. 77:912-915 |
| ISSN: | 1976-8524 0374-4884 |
| DOI: | 10.3938/jkps.77.912 |
| Popis: | In this paper, we report that the beam profile of the near-infrared light from superluminescent diodes (SLDs) can be measured with a resolution below the diffraction limit by using the photothermal effect and scanning thermal microscopy (SThM). Due to the sub-diffraction resolution of SThM, the beam profile measured using SThM was much clearer than the beam profile obtained by using the knife-edge method. By stacking cross-sectional images of the optical beam profile obtained by using SThM, we were able to obtain successively the three-dimensional optical beam profile. Our novel method of using small probes to measure optical beam profiles is compatible with conventional microscopy systems and can potentially be used in various applications. |
| Databáze: | OpenAIRE |
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