Soft X-Ray Microscopy; A New Technology for Examination of Parasitic Specimens

Autor:	A. Nair, C. R. Sterling, Wieslaw J. Kozek, Werner Meyer-Ilse, Carolyn A. Larabell, S. Garlapati, C. C. Wang, J. T. Brown, Greg Denbeaux
Rok vydání:	2003
Předmět:	Optics Materials science business.industry Soft x-ray microscopy business Instrumentation
Zdroj:	Microscopy and Microanalysis. 9:1452-1453
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927603447260
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::fe29902aba6dbe67d1c2c478b28d5363 https://doi.org/10.1017/s1431927603447260 Zobrazit plný text záznamu