Micrometer x-ray diffraction study ofVO2films: Separation between metal-insulator transition and structural phase transition
| Autor: | Hwa-Sick Yun, Sungyeoul Choi, Sun Jin Yun, Jungwook Lim, Tae-Ju Shin, Bong-Jun Kim, Hyun-Tak Kim, Yong Wook Lee |
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| Rok vydání: | 2008 |
| Předmět: |
Condensed Matter::Quantum Gases
Diffraction Materials science Condensed matter physics Mott insulator Condensed Matter Physics Electronic Optical and Magnetic Materials Mott transition Tetragonal crystal system X-ray crystallography Condensed Matter::Strongly Correlated Electrons Metal–insulator transition Electronic band structure Monoclinic crystal system |
| Zdroj: | Physical Review B. 77 |
| ISSN: | 1550-235X 1098-0121 |
| Popis: | In order to clarify whether ${\text{VO}}_{2}$ is a Mott insulator or a Peierls insulator, the metal-insulator transition (MIT) and the structural phase transition (SPT) are simultaneously monitored for ${\text{VO}}_{2}$ films by current-voltage curve and diffraction measurements using a synchrotron micro-x-ray beam. In the regime showing a metallic conductivity below the SPT temperature (approximately $70\text{ }\ifmmode^\circ\else\textdegree\fi{}\text{C}$), only the diffraction planes of the monoclinic structure are observed, while planes of the tetragonal structure are absent. This observation reveals the presence of a monoclinic and metal phase between the MIT and the SPT as a characteristic of a Mott insulator. |
| Databáze: | OpenAIRE |
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