Fast fault simulation for nonlinear analog circuits

Autor: N. Engin, H.G. Kerkhoff
Rok vydání: 2003
Předmět:
Zdroj: IEEE Design & Test of Computers. 20:40-47
ISSN: 0740-7475
Popis: A new method of transient fault simulation uses dc bias grouping of faulty circuits and decreases the number of Newton-Raphson iterations needed to reach a solution. An experimental tool implementing this method achieves a speedup of 20% to 30% on a flat netlist.
Databáze: OpenAIRE