| Autor: |
Doron Aurbach, Ernest Yeager, M. Daroux, G. McDougall |
| Rok vydání: |
1993 |
| Předmět: |
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| Zdroj: |
Journal of Electroanalytical Chemistry. 358:63-76 |
| ISSN: |
1572-6657 |
| DOI: |
10.1016/0022-0728(93)80431-g |
| Popis: |
The surface films formed on lithium in dimethoxyethane (DME) and LiAsF 6 solution in DME were investigated using X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) in an ultrahigh vacuum (UHV) system. Fresh Li surfaces in DME were prepared under UHV conditions by Argon sputtering of bulk lithium followed by immersion in the solution phase (under Argon), and characterization by the above spectroscopies, all within the UHV transfer system. It was found that the surface layers formed on Li in DME contain Li methoxide and LiOH or Li 2 O species (attributed to water reduction). When LiAsF 6 was present, the surface films also contained LiF. Depth profiling by Argon sputtering and AES measurements seem to be consistent with a bilayer structure of the surface films in which the oxide-hydroxide layer is abuts the Li surface and solvent reduction species comprise the outer part of the film. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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